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SanDisk has figured out how to measure the life of an SSD
SanDisk has proposed a Longterm Data Endurance (LDE) score, which converges an estimate of the expected life of a solid state drive to a single number. The company expects the industry to adopt this approach as a de facto standard.
It is common knowledge that the relatively low number of write cycles of flash memory is a limiting factor in SSD adoption. The industry lacks a single, standard measure of device durability. This problem has recently been brought to the attention of the specialized subcommittee of the industry standardization organization JEDEC.
An active member of the subcommittee is the world’s largest HDD manufacturer Seagate, which expects to launch an SSD next year. What’s more, Seagate is leading JEDEC’s efforts to develop SSD testing standards, including methods for assessing durability, reliability, performance, and shelf life.
Previously, manufacturers operated on the number of write-erase cycles of one NAND chip. The next step is to figure out how to perform this measurement for SSDs, as drive manufacturers use a variety of controllers, each with its own load balancing scheme to optimize device lifespan.
According to SanDisk, the key test in determining LDE should be measuring the total amount of data that can be written to the drive over its entire life (the corresponding value was designated TBW – Terabytes written).
It’s unclear if SanDisk’s approach will be adopted. SanDisk is known to have tested it in its labs and shared the results with PC and OS makers under a nondisclosure agreement. It remains to wait for the moment when the interested parties formally express their views on the SanDisk proposal.
Source: EE Times